Optical Metrology Engineer | Thin-Film Characterization | Laser Diagnostics
9+ years of experience designing precision metrology systems, characterizing dielectric coatings, and developing production-grade laser diagnostic instruments
I'm an Optical Metrology Engineer with 9+ years of experience in thin-film characterization and high-power laser diagnostics. Specialized in evaluating dielectric coatings designed for continuous-wave and pulsed laser systems operating at 1064 nm, 532 nm, and 355 nm. My expertise spans absorption measurements at the parts-per-million level, interferometric surface quality assessments, and the development of custom metrology instrumentation that bridges R&D innovation with manufacturing requirements.
With a Ph.D. in Electrical Engineering (Electro-Optics) from the University of Tennessee, my research background includes surface plasmon resonance near-field probing and nanoscale material characterization, with publications in Applied Physics Letters and New Journal of Physics.
IPG Photonics, Marlborough, MA
November 2021 – October 2023
IPG Photonics, Marlborough, MA
September 2018 – October 2021
Oak Ridge National Laboratory, Oak Ridge, TN
January 2015 – May 2018
University of Tennessee, Knoxville, TN — 2019
Dissertation: Nanoscale Probing of Modified Surfaces Using Surface Plasmons
Photofield electron emission from an optical fiber nanotip
Applied Physics Letters, 117(6), 061102
Surface plasmon enhanced fast electron emission from metallised fibre optic nanotips
New Journal of Physics, 22, 083069
Green's function for a sharpened and metal-coated dielectric probe
Applied Optics
Nanoscale Probing of Modified Surfaces Using Surface Plasmons
Doctoral Dissertation, University of Tennessee